JaCoW Logo

Reference Search

Favourites


For Word

[n]	R. Klein, P. Budz, K. Buerkmann-Gehrlein, J. Rahn, G. Ulm, and G. Wuestefeld, “The Metrology Light Source: an Electron Storage Ring Dedicated to Metrology”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPLS019, pp. 3314-3316. 
[n]	I. Senevirathne, N. Raut, and T. Powers, “Plasma processing of SRF cavities at Jefferson Lab: Experiment results and simulation insight”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 816-820. doi:10.18429/JACoW-NAPAC2025-WEP066
[n]	J. M. Schippers and H. H. Kiewiet, “A Beam Profile Monitor Using the Ionization of Residual Gas”, in Proc. Cyclotrons'92, Vancouver, Canada, Jul. 1992, paper IXD-03, pp. 477-478. 
[n]	T. Mooney, “synApps: EPICS-Application Software for Synchrotron Beamlines and Laboratories”, in Proc. PCaPAC'10, Saskatoon, Canada, Oct. 2010, paper THCOMA02, pp. 106-108. 
[n]	W. Vigano, B. Dehning, E. Effinger, G. G. Venturini, and C. Zamantzas, “Comparison of Three Different Concepts of High Dynamic Range and Dependability Optimised Current Measurement Digitisers for Beam Loss Systems”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPA09, pp. 66-70. 

For LaTeX

Use Complete Form

For BibTeX

References

Back to search