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[n]	R. Klein, P. Budz, K. Buerkmann-Gehrlein, J. Rahn, G. Ulm, and G. Wuestefeld, “The Metrology Light Source: an Electron Storage Ring Dedicated to Metrology”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPLS019, pp. 3314-3316. 
[n]	I. Senevirathne, N. Raut, and T. Powers, “Plasma processing of SRF cavities at Jefferson Lab: Experiment results and simulation insight”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 816-820. doi:10.18429/JACoW-NAPAC2025-WEP066
[n]	J. M. Schippers and H. H. Kiewiet, “A Beam Profile Monitor Using the Ionization of Residual Gas”, in Proc. Cyclotrons'92, Vancouver, Canada, Jul. 1992, paper IXD-03, pp. 477-478. 
[n]	T. Mooney, “synApps: EPICS-Application Software for Synchrotron Beamlines and Laboratories”, in Proc. PCaPAC'10, Saskatoon, Canada, Oct. 2010, paper THCOMA02, pp. 106-108. 

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