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[n]	X. Zhao, M. Krishnan, C. E. Reece, F. Williams, and Q. G. Yang, “Reciprocal Space XRD Mapping with Varied Incident Angle as a Probe of Structure Variation within Surface Depth”, in Proc. SRF'13, Paris, France, Sep. 2013, paper TUP084, pp. 651-658. 
[n]	W. Chou and J. Griffin, “Impedance Scaling and Impedance Control”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 7V034, pp. 1724-1726. 

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