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[n]	S. Kato, H. Hayano, T. Kubo, T. Noguchi, T. Saeki, and M. Sawabe, “Study on Niobium Scratch and Tantalum or Carbonaceous Contamination at Niobium Surface with Field Emission Scanner”, in Proc. SRF'13, Paris, France, Sep. 2013, paper TUP108, pp. 731-735. 

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