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[n]	P. B. Vasilev and A. M. Tron, “A New Technique for Transverse Phase Ellipse Measurement”, in Proc. LINAC'90, Albuquerque, NM, USA, Sep. 1990, paper TU461, pp. 477-479. 
[n]	M. Wang, T. R. Bieler, D. Kang, and C. Compton, “Characterization of Microstructural Defects in SRF Cavity Niobium using Electron Channeling Contrast Imaging”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 792-796. doi:10.18429/JACoW-SRF2017-THPB027

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