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[n]	R. Vaglio and V. Palmieri, “Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 374-377. doi:10.18429/JACoW-SRF2017-TUYBA02

For LaTeX

%\cite{Vaglio:SRF17-TUYBA02} \bibitem{Vaglio:SRF17-TUYBA02} R. Vaglio and V. Palmieri, \textquotedblleft{Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities}\textquotedblright, in \emph{Proc. SRF’17}, Lanzhou, China, Jul. 2017, pp. 374--377. \doi{10.18429/JACoW-SRF2017-TUYBA02}

For BibTeX

@inproceedings{vaglio:srf17-tuyba02, author = {R. Vaglio and V. Palmieri}, title = {{Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities}}, booktitle = {Proc. SRF'17}, pages = {374--377}, paper = {TUYBA02}, venue = {Lanzhou, China, Jul. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-SRF2017-TUYBA02}, url = {https://jacow.org/srf2017/papers/TUYBA02.pdf}, language = {english} }

References

• R. Vaglio and V. Palmieri, “Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities”, in Proc. 18th Int. Conf. RF Superconductivity (SRF'17), Lanzhou, China, Jul. 2017, pp. 374-377.