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[n]	A. A. Tishchenko, D. Yu. Sergeeva, M. N. Strikhanov, and K. O. Kruchinin, “Backward X-ray Transition Radiation from Multilayered Target for Submicron Beam Diagnostics”, in Proc. IPAC'13, Shanghai, China, May 2013, paper MOPME063, pp. 619-621. 

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