[n] W. Hartung et al., “Measurements of Secondary Electron Yield of Metal Surfaces and Films with Exposure to a Realistic Accelerator Environment”, in Proc. IPAC'13, Shanghai, China, May 2013, paper THPFI087, pp. 3493-3495.
%\cite{Hartung:IPAC13-THPFI087} \bibitem{Hartung:IPAC13-THPFI087} W. Hartung \emph{et al.}, \textquotedblleft{Measurements of Secondary Electron Yield of Metal Surfaces and Films with Exposure to a Realistic Accelerator Environment}\textquotedblright, in \emph{Proc. IPAC’13}, Shanghai, China, May 2013, paper THPFI087, pp. 3493--3495.
@inproceedings{hartung:ipac13-thpfi087, author = {W. Hartung and others}, title = {{Measurements of Secondary Electron Yield of Metal Surfaces and Films with Exposure to a Realistic Accelerator Environment}}, booktitle = {Proc. IPAC'13}, pages = {3493--3495}, paper = {THPFI087}, venue = {Shanghai, China, May 2013}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/IPAC2013/papers/THPFI087.pdf}, language = {english} }