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[n]	E. Carlier et al., “Commissioning of the Control System for the LHC Beam Dump Kicker Systems”, in Proc. ICALEPCS'09, Kobe, Japan, Oct. 2009, paper WEC001, pp. 391-393. 

[n]	Y. Tokuda and A. Usami, “Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy”, in Proc. PAC'81, Washington D.C., USA, Mar. 1981, pp. 3564-3569. 

For LaTeX

%\cite{Carlier:ICALEPCS09-WEC001} \bibitem{Carlier:ICALEPCS09-WEC001} E. Carlier \emph{et al.}, \textquotedblleft{Commissioning of the Control System for the LHC Beam Dump Kicker Systems}\textquotedblright, in \emph{Proc. ICALEPCS’09}, Kobe, Japan, Oct. 2009, paper WEC001, pp. 391--393. %\cite{Tokuda:PAC81} \bibitem{Tokuda:PAC81} Y. Tokuda and A. Usami, \textquotedblleft{Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy}\textquotedblright, in \emph{Proc. PAC’81}, Washington D.C., USA, Mar. 1981, pp. 3564--3569.

For BibTeX

@inproceedings{carlier:icalepcs09-wec001, author = {E. Carlier and others}, title = {{Commissioning of the Control System for the LHC Beam Dump Kicker Systems}}, booktitle = {Proc. ICALEPCS'09}, pages = {391--393}, paper = {WEC001}, venue = {Kobe, Japan, Oct. 2009}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/icalepcs2009/papers/WEC001.pdf}, language = {english} } @inproceedings{tokuda:pac81, author = {Y. Tokuda and A. Usami}, title = {{Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy}}, booktitle = {Proc. PAC'81}, pages = {3564--3569}, paper = {}, venue = {Washington D.C., USA, Mar. 1981}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} }

References

• E. Carlier et al., “Commissioning of the Control System for the LHC Beam Dump Kicker Systems”, in Proc. 12th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'09), Kobe, Japan, Oct. 2009, paper WEC001, pp. 391-393.
• Y. Tokuda and A. Usami, “Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy”, in Proc. 9th Particle Accelerator Conf. (PAC'81), Washington D.C., USA, Mar. 1981, pp. 3564-3569.