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[n]	T.-H. Kim, Y. Makita, S. Nakamura, T. Nakanishi, Y. Pu, and H. Tanaka, “Design and a Beam Test of an LEBT of a CW Microtron”, in Proc. EPAC'02, Paris, France, Jun. 2002, paper TUPDO014, pp. 2352-2354. 

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