[n] S. Leontein and E. Westlin, “Destructive Beam Profile Monitor Electronics using Gated Current Integrators”, in Proc. EPAC'98, Stockholm, Sweden, Jun. 1998, paper WEP10E, pp. 1550-1552.
%\cite{Leontein:EPAC98-WEP10E} \bibitem{Leontein:EPAC98-WEP10E} S. Leontein and E. Westlin, \textquotedblleft{Destructive Beam Profile Monitor Electronics using Gated Current Integrators}\textquotedblright, in \emph{Proc. EPAC’98}, Stockholm, Sweden, Jun. 1998, paper WEP10E, pp. 1550--1552.
@inproceedings{leontein:epac98-wep10e, author = {S. Leontein and E. Westlin}, title = {{Destructive Beam Profile Monitor Electronics using Gated Current Integrators}}, booktitle = {Proc. EPAC'98}, pages = {1550--1552}, paper = {WEP10E}, venue = {Stockholm, Sweden}, series = {European Particle Accelerator Conference}, number = {6}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {8}, year = {1998}, url = {https://jacow.org/e98/papers/WEP10E.pdf}, language = {english} }