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[n]	G. Arduini et al., “Extraction of 22 TeV/c Lead Ions from the CERN SPS Using a Bent Silicon Crystal”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 9P006, pp. 171-173. 
[n]	A. Kalinin, “Precise Instruments for Bunch Charge Measurement”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 3703-3705. doi:10.18429/JACoW-IPAC2014-THPME182
[n]	A. Meyer auf der Heide, B. B??sing, S. Khan, D. Krieg, and C. Mai, “Harmonic Off-Axis Seeding at the DELTA Short-Pulse Source”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 246-249. doi:10.18429/JACoW-FEL2019-TUP080
[n]	N. Angert et al., “The Unilac-Injector”, in Proc. LINAC'76, Chalk River, Canada, Sep. 1976, paper F02, pp. 321-326. 
[n]	J. Dedic, G. Jansa, M. Plesko, and R. Sabjan, “Uniform Motion Control Solution for Variety of Motion Applications”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper TUPP002, pp. 1526-1528. 
[n]	N. Higashi, K. Harada, T. Honda, Y. Kobayashi, N. Nakamura, and K. Hirano, “Current and Future of Storage Ring Based Light Sources in KEK”, in Proc. FLS'18, Shanghai, China, Mar. 2018, pp. 17-21. doi:10.18429/JACoW-FLS2018-MOP1WB03
[n]	M. C. Thompson et al., “The UCLA/SLAC Ultra-High Gradient Cerenkov Wakefield Accelerator Experiment”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper TPAE049, pp. 3067-3069. 
[n]	M. P. Stockli and R. F. Welton, “Emittance Scanner Optimization for Low Energy Ion Beams”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper RPAT042, pp. 2705-2707. 
[n]	A. Zelinsky, B. Borts, I. Ushakov, and I. Karnaukhov, “A tungsten neutron-generating target of a neutron source based on a subcritical assembly driven with an electron accelerator”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 1640-1643. doi:10.18429/JACoW-IPAC2023-TUPA149
[n]	J. Dedic, K. Zagar, and M. Plesko, “Beyond PCs: Accelerator Controls on Programmable Logic”, in Proc. ICALEPCS'07, Oak Ridge, TN, USA, Oct. 2007, paper WPPB15, pp. 433-435. 
[n]	G. P. Williams et al., “Calculations and Mitigation of THz Mirror Heating at the Jefferson Lab FEL”, in Proc. FEL'05, Palo Alto, CA, USA, Aug. 2005, paper TUPP058, pp. XX-XX. 
[n]	T. E. Oseroff, M. Liepe, and Z. Sun, “Sample Test Systems for Next-Gen SRF Surfaces”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 357. doi:10.18429/JACoW-SRF2021-TUOFDV07

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