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The page numbers for some of these references could not be added automatically. You must provide the page numbers from the original proceedings which is located at JACoW.org, and substitute ‘pp. XX-XX’ with the correct page numbers.
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[n] S.-P. Kao, F.-Z. Hsiao, and H.-H. Tsai, “Application of HAZOP and LOPA in the risk assessment of TPS LHe system at the NSRRC”, presented at the IPAC'25, Taipei, Taiwan, Jun. 2025, paper TUPB058, unpublished.
[n] S.-P. Kao, C. R. Chen, F.-Z. Hsiao, and J. P. Wang, “Safety Management for the Cryogenic System of Superconducting RF System”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper WPAE002, pp. 832-834.
[n] C. R. Chen, F. D. Chang, S.-P. Kao, R. J. Sheu, and J. P. Wang, “The Radiation Safety Interlock System for Top-Up Mode Operation at NSRRC”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper FPAT055, pp. 3328-3330.
[n] P. Jines and B. Craft, “PLC Based Upgrades for the CAMD Linac and Storage Ring Control System”, in Proc. ICALEPCS'01, San Jose, CA, USA, Nov. 2001, paper WEAP037, pp. XX-XX.
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References
- S.-P. Kao, F.-Z. Hsiao, and H.-H. Tsai, “Application of HAZOP and LOPA in the risk assessment of TPS LHe system at the NSRRC”, presented at the 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper TUPB058, this conference.
- S.-P. Kao, C. R. Chen, F.-Z. Hsiao, and J. P. Wang, “Safety Management for the Cryogenic System of Superconducting RF System”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WPAE002, pp. 832-834.
- C. R. Chen, F. D. Chang, S.-P. Kao, R. J. Sheu, and J. P. Wang, “The Radiation Safety Interlock System for Top-Up Mode Operation at NSRRC”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper FPAT055, pp. 3328-3330.
- P. Jines and B. Craft, “PLC Based Upgrades for the CAMD Linac and Storage Ring Control System”, in Proc. 8th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'01), San Jose, CA, USA, Nov. 2001, paper WEAP037, pp. XX-XX.
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