[n] Choi H., Baang S., Baek S.H., Chang Y.B., Kim K., Kim Y.J., Kim S.B., Kim M.K., Kim J.H., Kim J.S., Lee S.I., Lee Y.H., Lim B.S., Park H.K., Park K.R., Yee J., Yoon C.S., “Data Acquisition and Control System for Samsung Superconductor Test Facility”, in Proc. ICALEPCS'99, Trieste, Italy, Oct. 1999, paper TC1P70, pp. XX-XX.
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