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[n]	G. Ha, M.-H. Cho, W. Namkung, W. Gai, K.-J. Kim, and J. G. Power, “High Resolution Longitudinal Property Measurement using Emittance Exchange Beam Line”, in Proc. IPAC'15, Richmond, VA, USA, May 2015, pp. 320-322. doi:10.18429/JACoW-IPAC2015-MOPJE020

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