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[n]	Y. Zhao et al., “Recent Progress on Ion Source of SC200 Cyclotron”, in Proc. Cyclotrons'19, Cape Town, South Africa, Sep. 2019, pp. 24-26. doi:10.18429/JACoW-CYCLOTRONS2019-MOP002
[n]	J. Galambos, C. K. Allen, and W. Blokland, “Beam Profile Measurements and Matching at SNS: Practical Considerations and Accommodations”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper TUP087, pp. 611-613. 

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