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[n]	A. Vasyliev, O. O. Bolshov, K. Galaydych, A. I. Povrozin, and G. V. Sotnikov, “Influence of the Profile of the Dielectric Structure on the Electric Fields Excited by a Laser in Dielectric Accelerators Based on Chip”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 2026-2029. doi:10.18429/JACoW-IPAC2021-TUPAB247
[n]	J. Norem et al., “Tests of a High Resolution Beam Profile Monitor”, in Proc. PAC'95, Dallas, TX, USA, May 1995, paper TPC16, pp. 2637-2639. 

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