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[n]	R. Heuer, T. W. Debiak, J. Porter, and I. Birnbaum, “An Electrostatic Sweep Plate Device for Emittance Measurement of Ion Beams to 2 MeV”, in Proc. PAC'93, Washington D.C., USA, Mar. 1993, pp. 2420-2423. 

[n]	A. H. Lumpkin, W. J. Berg, and B. X. Yang, “Planned Optical Diagnostics for the APS Low-Energy Undulator Test Line”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 3V019, pp. 871-873. 

[n]	A. X. Ding et al., “Impedance Characteristic Analysis and Matching Network Design for a 100 mA H⁻ Ion Source”, in Proc. Cyclotrons'22, Beijing, China, Dec. 2022, paper MOPO005, pp. 58-61. doi:10.18429/JACoW-CYCLOTRONS2022-MOPO005

[n]	Z. Sun et al., “Inverse inference of initial beam profile and key parameters based on automatic differentiation method”, in Proc. LINAC'24, Chicago, IL, USA, Aug. 2024, pp. 702-704. doi:10.18429/JACoW-LINAC2024-THPB033

For LaTeX

%\cite{Heuer:PAC93} \bibitem{Heuer:PAC93} R. Heuer, T. W. Debiak, J. Porter, and I. Birnbaum, \textquotedblleft{An Electrostatic Sweep Plate Device for Emittance Measurement of Ion Beams to 2 MeV}\textquotedblright, in \emph{Proc. PAC’93}, Washington D.C., USA, Mar. 1993, pp. 2420--2423. %\cite{Lumpkin:PAC97-3V019} \bibitem{Lumpkin:PAC97-3V019} A. H. Lumpkin, W. J. Berg, and B. X. Yang, \textquotedblleft{Planned Optical Diagnostics for the APS Low-Energy Undulator Test Line}\textquotedblright, in \emph{Proc. PAC’97}, Vancouver, Canada, May 1997, paper 3V019, pp. 871--873. %\cite{Ding:Cyclotrons22-MOPO005} \bibitem{Ding:Cyclotrons22-MOPO005} A. X. Ding \emph{et al.}, \textquotedblleft{Impedance Characteristic Analysis and Matching Network Design for a 100 mA H⁻ Ion Source}\textquotedblright, in \emph{Proc. Cyclotrons’22}, Beijing, China, Dec. 2022, paper MOPO005, pp. 58--61. \doi{10.18429/JACoW-CYCLOTRONS2022-MOPO005} %\cite{Sun:LINAC24-THPB033} \bibitem{Sun:LINAC24-THPB033} Z. Sun \emph{et al.}, \textquotedblleft{Inverse inference of initial beam profile and key parameters based on automatic differentiation method}\textquotedblright, in \emph{Proc. LINAC’24}, Chicago, IL, USA, Aug. 2024, pp. 702--704. \doi{10.18429/JACoW-LINAC2024-THPB033}

For BibTeX

@inproceedings{heuer:pac93, author = {R. Heuer and T. W. Debiak and J. Porter and I. Birnbaum}, title = {{An Electrostatic Sweep Plate Device for Emittance Measurement of Ion Beams to 2 MeV}}, booktitle = {Proc. PAC'93}, pages = {2420--2423}, paper = {}, venue = {Washington D.C., USA, Mar. 1993}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{lumpkin:pac97-3v019, author = {A. H. Lumpkin and W. J. Berg and B. X. Yang}, title = {{Planned Optical Diagnostics for the APS Low-Energy Undulator Test Line}}, booktitle = {Proc. PAC'97}, pages = {871--873}, paper = {3V019}, venue = {Vancouver, Canada, May 1997}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{ding:cyclotrons22-mopo005, author = {A. X. Ding and others}, title = {{Impedance Characteristic Analysis and Matching Network Design for a 100 mA H⁻ Ion Source}}, booktitle = {Proc. Cyclotrons'22}, pages = {58--61}, paper = {MOPO005}, venue = {Beijing, China}, series = {International Conference on Cyclotrons and their Applications}, number = {23}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {3}, year = {2023}, issn = {2673-5482}, isbn = {978-3-95-450212-7}, doi = {10.18429/JACoW-CYCLOTRONS2022-MOPO005}, language = {english} } @inproceedings{sun:linac24-thpb033, author = {Z. Sun and others}, title = {{Inverse inference of initial beam profile and key parameters based on automatic differentiation method}}, booktitle = {Proc. LINAC'24}, pages = {702--704}, paper = {THPB033}, venue = {Chicago, IL, USA}, series = {Linear Accelerator Conference}, number = {32}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {8}, year = {2024}, issn = {2226-0366}, isbn = {978-3-95-450219-6}, doi = {10.18429/JACoW-LINAC2024-THPB033}, language = {english} }

References

• R. Heuer, T. W. Debiak, J. Porter, and I. Birnbaum, “An Electrostatic Sweep Plate Device for Emittance Measurement of Ion Beams to 2 MeV”, in Proc. 15th Particle Accelerator Conf. (PAC'93), Washington D.C., USA, Mar. 1993, pp. 2420-2423.
• A. H. Lumpkin, W. J. Berg, and B. X. Yang, “Planned Optical Diagnostics for the APS Low-Energy Undulator Test Line”, in Proc. 17th Particle Accelerator Conf. (PAC'97), Vancouver, Canada, May 1997, paper 3V019, pp. 871-873.
• A. X. Ding et al., “Impedance Characteristic Analysis and Matching Network Design for a 100 mA H⁻ Ion Source”, in Proc. 23rd Int. Conf. Cyclotrons Appl. (Cyclotrons'22), Beijing, China, Dec. 2022, paper MOPO005, pp. 58-61.
• Z. Sun et al., “Inverse inference of initial beam profile and key parameters based on automatic differentiation method”, in Proc. 32nd Linear Accelerator Conf. (LINAC'24), Chicago, IL, USA, Aug. 2024, pp. 702-704.