[n] D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. doi:10.18429/JACoW-SRF2021-SUPFDV016
%\cite{Seal:SRF21-SUPFDV016} \bibitem{Seal:SRF21-SUPFDV016} D. J. Seal \emph{et al.}, \textquotedblleft{A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate}\textquotedblright, in \emph{Proc. SRF’21}, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. \doi{10.18429/JACoW-SRF2021-SUPFDV016}
@inproceedings{seal:srf21-supfdv016, author = {D. J. Seal and others}, title = {{A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate}}, booktitle = {Proc. SRF'21}, pages = {100}, paper = {SUPFDV016}, venue = {East Lansing, MI, USA}, series = {International Conference on RF Superconductivity}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2022}, issn = {2673-5504}, isbn = {978-3-95-450233-2}, doi = {10.18429/JACoW-SRF2021-SUPFDV016}, url = {https://jacow.org/srf2021/papers/SUPFDV016.pdf}, language = {english} }