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[n]	J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 283-285. doi:10.18429/JACoW-IPAC2016-MOPMR023

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