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[n]	J. H. Ko and H.-S. Kang, “Terahertz FEL Simulation in PAL XFEL”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 77-79. doi:10.18429/JACoW-FEL2019-TUP017

[n]	C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Micro-Bunching Instability Monitor for X-ray Free Electron Laser”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 404-406. doi:10.18429/JACoW-IBIC2018-WEPA16

For LaTeX

%\cite{JHKo:FEL19-TUP017} \bibitem{JHKo:FEL19-TUP017} J. H. Ko and H.-S. Kang, \textquotedblleft{Terahertz FEL Simulation in PAL XFEL}\textquotedblright, in \emph{Proc. FEL’19}, Hamburg, Germany, Aug. 2019, pp. 77--79. \doi{10.18429/JACoW-FEL2019-TUP017} %\cite{Kim:IBIC18-WEPA16} \bibitem{Kim:IBIC18-WEPA16} C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, \textquotedblleft{Micro-Bunching Instability Monitor for X-ray Free Electron Laser}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 404--406. \doi{10.18429/JACoW-IBIC2018-WEPA16}

For BibTeX

@inproceedings{jhko:fel19-tup017, author = {J. H. Ko and H.-S. Kang}, title = {{Terahertz FEL Simulation in PAL XFEL}}, booktitle = {Proc. FEL'19}, pages = {77--79}, paper = {TUP017}, venue = {Hamburg, Germany, Aug. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-FEL2019-TUP017}, url = {https://jacow.org/fel2019/papers/TUP017.pdf}, language = {english} } @inproceedings{kim:ibic18-wepa16, author = {C. Kim and H.-S. Kang and G. Kim and I. S. Ko and J. H. Ko}, title = {{Micro-Bunching Instability Monitor for X-ray Free Electron Laser}}, booktitle = {Proc. IBIC'18}, pages = {404--406}, paper = {WEPA16}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPA16}, url = {https://jacow.org/IBIC2018/papers/WEPA16.pdf}, language = {english} }

References

• J. H. Ko and H.-S. Kang, “Terahertz FEL Simulation in PAL XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 77-79.
• C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Micro-Bunching Instability Monitor for X-ray Free Electron Laser”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 404-406.