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[n]	C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Micro-Bunching Instability Monitor for X-ray Free Electron Laser”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 404-406. doi:10.18429/JACoW-IBIC2018-WEPA16

For LaTeX

%\cite{Kim:IBIC18-WEPA16} \bibitem{Kim:IBIC18-WEPA16} C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, \textquotedblleft{Micro-Bunching Instability Monitor for X-ray Free Electron Laser}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 404--406. \doi{10.18429/JACoW-IBIC2018-WEPA16}

For BibTeX

@inproceedings{kim:ibic18-wepa16, author = {C. Kim and H.-S. Kang and G. Kim and I. S. Ko and J. H. Ko}, title = {{Micro-Bunching Instability Monitor for X-ray Free Electron Laser}}, booktitle = {Proc. IBIC'18}, pages = {404--406}, paper = {WEPA16}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPA16}, url = {https://jacow.org/IBIC2018/papers/WEPA16.pdf}, language = {english} }

References

• C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Micro-Bunching Instability Monitor for X-ray Free Electron Laser”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 404-406.