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[n]	T. Lensch, S. Liu, and M. Scholz, “The European XFEL Wire Scanner System”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 498-500. doi:10.18429/JACoW-IBIC2018-WEPC05

For LaTeX

%\cite{Lensch:IBIC18-WEPC05} \bibitem{Lensch:IBIC18-WEPC05} T. Lensch, S. Liu, and M. Scholz, \textquotedblleft{The European XFEL Wire Scanner System}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 498--500. \url{doi:10.18429/JACoW-IBIC2018-WEPC05}

For BibTeX

@inproceedings{lensch:ibic18-wepc05, author = {T. Lensch and S. Liu and M. Scholz}, title = {{The European XFEL Wire Scanner System}}, booktitle = {Proc. IBIC'18}, pages = {498--500}, paper = {WEPC05}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPC05}, url = {https://jacow.org/IBIC2018/papers/WEPC05.pdf}, language = {english} }

References

• T. Lensch, S. Liu, and M. Scholz, “The European XFEL Wire Scanner System”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 498-500.