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[n]	T. Plath et al., “Extraction of the Longitudinal Profile of the Transverse Emittance From Single-Shot RF Deflector Measurements at sFLASH”, in Proc. FEL'17, Santa Fe, NM, USA, Aug. 2017, pp. 98-101. doi:10.18429/JACoW-FEL2017-MOP028

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