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[n] Y. Suetsugu and K. Kanazawa, “Test Fabrication of a Copper Beam Duct for the KEK B-Factory”, in Proc. PAC'93, Washington D.C., USA, Mar. 1993, pp. 3860-3863.
[n] J. Xiao, T. He, and W. Li, “Longitudinal beam dynamics tracking simulation for the triple radio-frequency system in electron storage rings”, presented at the IPAC'25, Taipei, Taiwan, Jun. 2025, paper MOPM073, unpublished.
[n] T. He, Z. Bai, W. Li, and J. Xiao, “GPU-Accelerated Study of Longitudinal Single-Bunch Instability in Electron Storage Rings”, presented at the IPAC'25, Taipei, Taiwan, Jun. 2025, paper WEPS006, unpublished.
[n] J. Xiao, T. He, and W. Li, “Steady-state response matrix of radio-frequency cavity voltage in storage rings”, presented at the IPAC'25, Taipei, Taiwan, Jun. 2025, paper MOPM075, unpublished.
[n] L. R. Prost and A. V. Shemyakin, “The PXIE LEBT Design Choices”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 958-960. doi:10.18429/JACoW-IPAC2016-MOPOY049
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References
- Y. Suetsugu and K. Kanazawa, “Test Fabrication of a Copper Beam Duct for the KEK B-Factory”, in Proc. 15th Particle Accelerator Conf. (PAC'93), Washington D.C., USA, Mar. 1993, pp. 3860-3863.
- J. Xiao, T. He, and W. Li, “Longitudinal beam dynamics tracking simulation for the triple radio-frequency system in electron storage rings”, presented at the 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper MOPM073, unpublished.
- T. He, Z. Bai, W. Li, and J. Xiao, “GPU-Accelerated Study of Longitudinal Single-Bunch Instability in Electron Storage Rings”, presented at the 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper WEPS006, unpublished.
- J. Xiao, T. He, and W. Li, “Steady-state response matrix of radio-frequency cavity voltage in storage rings”, presented at the 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper MOPM075, unpublished.
- L. R. Prost and A. V. Shemyakin, “The PXIE LEBT Design Choices”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 958-960.
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