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[n]	S. J. Lee, J. H. Han, Y. G. Jung, D. E. Kim, and G. Mun, “Radiation Damage Monitoring at PAL-XFEL”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 528-530. doi:10.18429/JACoW-FEL2019-WEP093

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