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For Word

[n]	W. I. B. Smith, “Beam Defining Slits and Focusing Grids Near the Ion Source”, in Proc. Cyclotrons'59, Oak Ridge, TN, USA, Jul. 1959, paper CYC59D03, pp. 183-191. 

[n]	B. Gao, Y. B. Leng, and X. Y. Xu, “Deep Learning Applied for Multi-Slit Imaging Based Beam Size Monitor”, in Proc. IPAC'19, Melbourne, Australia, May 2019, pp. 2587-2590. doi:10.18429/JACoW-IPAC2019-WEPGW049

For LaTeX

%\cite{Smith:Cyclotrons59-CYC59D03} \bibitem{Smith:Cyclotrons59-CYC59D03} W. I. B. Smith, \textquotedblleft{Beam Defining Slits and Focusing Grids Near the Ion Source}\textquotedblright, in \emph{Proc. Cyclotrons’59}, Oak Ridge, TN, USA, Jul. 1959, paper CYC59D03, pp. 183--191. %\cite{Gao:IPAC19-WEPGW049} \bibitem{Gao:IPAC19-WEPGW049} B. Gao, Y. B. Leng, and X. Y. Xu, \textquotedblleft{Deep Learning Applied for Multi-Slit Imaging Based Beam Size Monitor}\textquotedblright, in \emph{Proc. IPAC’19}, Melbourne, Australia, May 2019, pp. 2587--2590. \url{doi:10.18429/JACoW-IPAC2019-WEPGW049}

For BibTeX

@inproceedings{smith:cyclotrons59-cyc59d03, author = {W. I. B. Smith}, title = {{Beam Defining Slits and Focusing Grids Near the Ion Source}}, booktitle = {Proc. Cyclotrons'59}, pages = {183--191}, paper = {CYC59D03}, venue = {Oak Ridge, TN, USA, Jul. 1959}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/c59/papers/CYC59D03.pdf}, language = {english} } @inproceedings{gao:ipac19-wepgw049, author = {B. Gao and Y. B. Leng and X. Y. Xu}, title = {{Deep Learning Applied for Multi-Slit Imaging Based Beam Size Monitor}}, booktitle = {Proc. IPAC'19}, pages = {2587--2590}, paper = {WEPGW049}, venue = {Melbourne, Australia, May 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2019-WEPGW049}, url = {http://accelconf.web.cern.ch/ipac2019/papers/WEPGW049.pdf}, language = {english} }

References

• W. I. B. Smith, “Beam Defining Slits and Focusing Grids Near the Ion Source”, in Proc. Conf. on Sector-Focused Cyclotrons (Cyclotrons'59), Oak Ridge, TN, USA, Jul. 1959, paper CYC59D03, pp. 183-191.
• B. Gao, Y. B. Leng, and X. Y. Xu, “Deep Learning Applied for Multi-Slit Imaging Based Beam Size Monitor”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 2587-2590.