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C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844. |
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C. E. Reece, P. Denny, and A. V. Reilly, “Performance Characteristics of Jefferson Lab's New SRF Infrastructure”, in Proc. 16th Int. Conf. RF Superconductivity (SRF'13), Paris, France, Sep. 2013, paper MOP044, pp. 216-219. |
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C. E. Reece, S. Castagnola, P. Denny, and A. L. A. Mitchell, “New Improved Horizontal Electropolishing System for SRF Cavities”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 237. |
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C. M. Ginsburg and C. E. Reece, “CEBAF Operations in the 12 GeV Era”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, paper WEPFAV003, pp.. |
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C. Xu, M. J. Kelley, and C. E. Reece, “Analysis of High Field Non-Linear Losses on SRF Surfaces Due to Specific Topographic Roughness”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEEPPB011, pp. 2188-2190. |
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C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper MOPB018, pp. 210-212. |
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C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. 26th Linear Accelerator Conf. (LINAC'12), Tel Aviv, Israel, Sep. 2012, paper SUPB001, pp. XX-XX. |
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C. Xu, M. J. Kelley, and C. E. Reece, “Simulation of Non-linear RF Losses Derived from Characteristic Nb Topography”, in Proc. 16th Int. Conf. RF Superconductivity (SRF'13), Paris, France, Sep. 2013, paper TUP010, pp. 441-443. |
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C. Xu, M. J. Kelley, and C. E. Reece, “SRF Cavity Surface Topography Characterization Using Replica Techniques”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper THPPC093, pp. 3497-3499. |
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C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834. |
