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[n] F. Addesa et al., “Minimally Invasive Nano-Fabricated Wire Scanner for FEL Operations”, presented at the IBIC'25, Liverpool, UK, Sep. 2025, paper WECC01, unpublished.
[n] V. Sajaev, M. Borland, Y.-C. Chae, and L. Emery, “Experimental Verification of Single-bunch Accumulation Limit Dependence on Impedance at the APS”, in Proc. NAPAC'13, Pasadena, CA, USA, Sep.-Oct. 2013, paper TUOBB2, pp. 405-407.
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References
- F. Addesa et al., “Minimally Invasive Nano-Fabricated Wire Scanner for FEL Operations”, presented at the 14th International Beam Instrumentation Conference (IBIC'25), Liverpool, UK, Sep. 2025, paper WECC01, unpublished.
- V. Sajaev, M. Borland, Y.-C. Chae, and L. Emery, “Experimental Verification of Single-bunch Accumulation Limit Dependence on Impedance at the APS”, in Proc. North American Particle Accelerator Conf. (NAPAC'13), Pasadena, CA, USA, Sep.-Oct. 2013, paper TUOBB2, pp. 405-407.
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