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[n]	Y. X. Zhang, X. Q. Ge, S. W. Wang, Y. Wang, W. Wei, and B. Zhang, “Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 4980-4982. doi:10.18429/JACoW-IPAC2018-THPML128

For LaTeX

%\cite{Zhang:IPAC18-THPML128} \bibitem{Zhang:IPAC18-THPML128} Y. X. Zhang, X. Q. Ge, S. W. Wang, Y. Wang, W. Wei, and B. Zhang, \textquotedblleft{Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film}\textquotedblright, in \emph{Proc. IPAC’18}, Vancouver, Canada, Apr.-May 2018, pp. 4980--4982. \url{doi:10.18429/JACoW-IPAC2018-THPML128}

For BibTeX

@inproceedings{zhang:ipac18-thpml128, author = {Y. X. Zhang and X. Q. Ge and S. W. Wang and Y. Wang and W. Wei and B. Zhang}, title = {{Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film}}, booktitle = {Proc. IPAC'18}, pages = {4980--4982}, paper = {THPML128}, venue = {Vancouver, Canada, Apr.-May 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2018-THPML128}, url = {http://accelconf.web.cern.ch/ipac2018/papers/THPML128.pdf}, language = {english} }

References

• Y. X. Zhang, X. Q. Ge, S. W. Wang, Y. Wang, W. Wei, and B. Zhang, “Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4980-4982.