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[n]	T. F. Silva, Z. O. Guimar?úes-Filho, C. Jahnke, and M. N. Martins, “Electron Beam Profile Determination: The Influence of Charge Saturation in Phosphor Screens”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper TH6REP040, pp. 4039-4041. 

[n]	T. Abe, “THE ION-BEAM BREEDING MAKES GREAT SUCCESS IN PLANT BUSINESS”, in Proc. Cyclotrons'04, Tokyo, Japan, Oct. 2004, paper 19B2, pp. XX-XX. 

[n]	J. Wang et al., “Comparison Studies of Graphene Sey Results in NSRL and DL”, in Proc. IPAC'17, Copenhagen, Denmark, May 2017, pp. 3196-3199. doi:10.18429/JACoW-IPAC2017-WEPIK107

For LaTeX

%\cite{Silva:PAC09-TH6REP040} \bibitem{Silva:PAC09-TH6REP040} T. F. Silva, Z. O. Guimar?úes-Filho, C. Jahnke, and M. N. Martins, \textquotedblleft{Electron Beam Profile Determination: The Influence of Charge Saturation in Phosphor Screens}\textquotedblright, in \emph{Proc. PAC’09}, Vancouver, Canada, May 2009, paper TH6REP040, pp. 4039--4041. %\cite{Abe:Cyclotrons04-19B2} \bibitem{Abe:Cyclotrons04-19B2} T. Abe, \textquotedblleft{THE ION-BEAM BREEDING MAKES GREAT SUCCESS IN PLANT BUSINESS}\textquotedblright, in \emph{Proc. Cyclotrons’04}, Tokyo, Japan, Oct. 2004, paper 19B2, pp. XX--XX. %\cite{Wang:IPAC17-WEPIK107} \bibitem{Wang:IPAC17-WEPIK107} J. Wang \emph{et al.}, \textquotedblleft{Comparison Studies of Graphene Sey Results in NSRL and DL}\textquotedblright, in \emph{Proc. IPAC’17}, Copenhagen, Denmark, May 2017, pp. 3196--3199. \doi{10.18429/JACoW-IPAC2017-WEPIK107}

For BibTeX

@inproceedings{silva:pac09-th6rep040, author = {T. F. Silva and Z. O. Guimar?úes-Filho and C. Jahnke and M. N. Martins}, title = {{Electron Beam Profile Determination: The Influence of Charge Saturation in Phosphor Screens}}, booktitle = {Proc. PAC'09}, pages = {4039--4041}, paper = {TH6REP040}, venue = {Vancouver, Canada, May 2009}, series = {Particle Accelerator Conference}, number = {23}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/PAC2009/papers/TH6REP040.pdf}, language = {english} } @inproceedings{abe:cyclotrons04-19b2, author = {T. Abe}, title = {{THE ION-BEAM BREEDING MAKES GREAT SUCCESS IN PLANT BUSINESS}}, booktitle = {Proc. Cyclotrons'04}, paper = {19B2}, venue = {Tokyo, Japan, Oct. 2004}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{wang:ipac17-wepik107, author = {J. Wang and others}, title = {{Comparison Studies of Graphene Sey Results in NSRL and DL}}, booktitle = {Proc. IPAC'17}, pages = {3196--3199}, paper = {WEPIK107}, venue = {Copenhagen, Denmark, May 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2017-WEPIK107}, url = {https://jacow.org/ipac2017/papers/WEPIK107.pdf}, language = {english} }

References

• T. F. Silva, Z. O. Guimar?úes-Filho, C. Jahnke, and M. N. Martins, “Electron Beam Profile Determination: The Influence of Charge Saturation in Phosphor Screens”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper TH6REP040, pp. 4039-4041.
• T. Abe, “THE ION-BEAM BREEDING MAKES GREAT SUCCESS IN PLANT BUSINESS”, in Proc. 17th Int. Conf. on Cyclotrons and Their Applications (Cyclotrons'04), Tokyo, Japan, Oct. 2004, paper 19B2, pp. XX-XX.
• J. Wang et al., “Comparison Studies of Graphene Sey Results in NSRL and DL”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 3196-3199.