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[n]	N. Baboi, B. Lorbeer, P. Zhang, N. Eddy, B. J. Fellenz, and M. Wendt, “HOM Choice Study with Test Electronics for use as Beam Position Diagnostics in 3.9 GHz Accelerating Cavities in FLASH”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper TUPA16, pp. 364-368. 

For LaTeX

%\cite{Baboi:IBIC12-TUPA16} \bibitem{Baboi:IBIC12-TUPA16} N. Baboi, B. Lorbeer, P. Zhang, N. Eddy, B. J. Fellenz, and M. Wendt, \textquotedblleft{HOM Choice Study with Test Electronics for use as Beam Position Diagnostics in 3.9 GHz Accelerating Cavities in FLASH}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper TUPA16, pp. 364--368.

For BibTeX

@inproceedings{baboi:ibic12-tupa16, author = {N. Baboi and B. Lorbeer and P. Zhang and N. Eddy and B. J. Fellenz and M. Wendt}, title = {{HOM Choice Study with Test Electronics for use as Beam Position Diagnostics in 3.9 GHz Accelerating Cavities in FLASH}}, booktitle = {Proc. IBIC'12}, pages = {364--368}, paper = {TUPA16}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/TUPA16.pdf}, language = {english} }

References

• N. Baboi, B. Lorbeer, P. Zhang, N. Eddy, B. J. Fellenz, and M. Wendt, “HOM Choice Study with Test Electronics for use as Beam Position Diagnostics in 3.9 GHz Accelerating Cavities in FLASH”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA16, pp. 364-368.