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[n]	T. Lensch, S. Liu, and M. Scholz, “The European XFEL Wire Scanner System”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 498-500. doi:10.18429/JACoW-IBIC2018-WEPC05
[n]	N. Delerue et al., “Longitudinal Profile Monitor Using Smith-Purcell Radiation: Recent Results from the E-203 Collaboration”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper TUPC38, pp. 464-466. 

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