Reference Search

Favourites

For Word

[n]	L. Parsons Fran?ºa et al., “Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines”, in Proc. IBIC'22, Kraków, Poland, Sep. 2022, pp. 476-480. doi:10.18429/JACoW-IBIC2022-WEP32

For LaTeX

%\cite{Parsons Fran?ºa:IBIC22-WEP32} \bibitem{Parsons Fran?ºa:IBIC22-WEP32} L. Parsons Fran?ºa \emph{et al.}, \textquotedblleft{Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines}\textquotedblright, in \emph{Proc. IBIC’22}, Kraków, Poland, Sep. 2022, pp. 476--480. \url{doi:10.18429/JACoW-IBIC2022-WEP32}

For BibTeX

@inproceedings{parsons fran?ºa:ibic22-wep32, author = {L. Parsons Fran?ºa and others}, title = {{Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines}}, booktitle = {Proc. IBIC'22}, pages = {476--480}, paper = {WEP32}, venue = {Kraków, Poland}, series = {International Beam Instrumentation Conference}, number = {11}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2022}, issn = {2673-5350}, isbn = {978-3-95-450241-7}, doi = {10.18429/JACoW-IBIC2022-WEP32}, language = {english} }

References

• L. Parsons Fran?ºa et al., “Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 476-480.