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For Word

[n]	C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, and M. Yan, “Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 153-156. doi:10.18429/JACoW-IBIC2017-TUPCC03

For LaTeX

%\cite{Gerth:IBIC17-TUPCC03} \bibitem{Gerth:IBIC17-TUPCC03} C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, and M. Yan, \textquotedblleft{Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 153--156. \url{doi:10.18429/JACoW-IBIC2017-TUPCC03}

For BibTeX

@inproceedings{gerth:ibic17-tupcc03, author = {C. Gerth and B. Beutner and O. Hensler and F. Obier and M. Scholz and M. Yan}, title = {{Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL}}, booktitle = {Proc. IBIC'17}, pages = {153--156}, paper = {TUPCC03}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-TUPCC03}, url = {https://jacow.org/ibic2017/papers/TUPCC03.pdf}, language = {english} }

References

• C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, and M. Yan, “Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 153-156.