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[n] J. J. Nebrensky and P. M. Hanlet, “POMPOMs: Cost-Efficient Polarity Sensors for the MICE Muon Beamline”, in Proc. DIPAC'11, Hamburg, Germany, May 2011, paper TUPD90, pp. 518-520.
[n] C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, and M. Yan, “Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 153-156. doi:10.18429/JACoW-IBIC2017-TUPCC03
[n] B. E. Bjaerngard, G. T. Y. Chen, and B. J. Maddox, “High Resolution Beam Profile Measurements Using Phosphorescence”, in Proc. PAC'75, Washington D.C., USA, Mar. 1975, pp. 1558-1561.
[n] C. Bieth et al., “Superconducting Booster Cyclotron Studies at GANIL”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 431-434.
[n] J. C. Collins and Wm. Manwaring, “Use of Microcomputers in the IUCF Control System”, in Proc. Cyclotrons'81, Caen, France, Sep. 1981, paper FP-06, pp. 601-603.
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References
- J. J. Nebrensky and P. M. Hanlet, “POMPOMs: Cost-Efficient Polarity Sensors for the MICE Muon Beamline”, in Proc. 10th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'11), Hamburg, Germany, May 2011, paper TUPD90, pp. 518-520.
- C. Gerth, B. Beutner, O. Hensler, F. Obier, M. Scholz, and M. Yan, “Online Longitudinal Bunch Profile and Slice Emittance Diagnostics at the European XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 153-156.
- B. E. Bjaerngard, G. T. Y. Chen, and B. J. Maddox, “High Resolution Beam Profile Measurements Using Phosphorescence”, in Proc. 6th Particle Accelerator Conf. (PAC'75), Washington D.C., USA, Mar. 1975, pp. 1558-1561.
- C. Bieth et al., “Superconducting Booster Cyclotron Studies at GANIL”, in Proc. 2nd European Particle Accelerator Conf. (EPAC'90), Nice, France, Jun. 1990, pp. 431-434.
- J. C. Collins and Wm. Manwaring, “Use of Microcomputers in the IUCF Control System”, in Proc. 9th Int. Cyclotron Conf. and Their Applications (Cyclotrons'81), Caen, France, Sep. 1981, paper FP-06, pp. 601-603.
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