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For Word

[n]	C. Y. Liao, Y.-S. Cheng, K. T. Hsu, K. H. Hu, C. H. Huang, and C. Y. Wu, “Beam Trip Diagnostics for the TPS”, in Proc. IBIC'17, Grand Rapids, MI, USA, Aug. 2017, pp. 458-460. doi:10.18429/JACoW-IBIC2017-WEPWC07

For LaTeX

%\cite{Liao:IBIC17-WEPWC07} \bibitem{Liao:IBIC17-WEPWC07} C. Y. Liao, Y.-S. Cheng, K. T. Hsu, K. H. Hu, C. H. Huang, and C. Y. Wu, \textquotedblleft{Beam Trip Diagnostics for the TPS}\textquotedblright, in \emph{Proc. IBIC’17}, Grand Rapids, MI, USA, Aug. 2017, pp. 458--460. \doi{10.18429/JACoW-IBIC2017-WEPWC07}

For BibTeX

@inproceedings{liao:ibic17-wepwc07, author = {C. Y. Liao and Y.-S. Cheng and K. T. Hsu and K. H. Hu and C. H. Huang and C. Y. Wu}, title = {{Beam Trip Diagnostics for the TPS}}, booktitle = {Proc. IBIC'17}, pages = {458--460}, paper = {WEPWC07}, venue = {Grand Rapids, MI, USA, Aug. 2017}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2017-WEPWC07}, url = {https://jacow.org/ibic2017/papers/WEPWC07.pdf}, language = {english} }

References

• C. Y. Liao, Y.-S. Cheng, K. T. Hsu, K. H. Hu, C. H. Huang, and C. Y. Wu, “Beam Trip Diagnostics for the TPS”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 458-460.