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[n]	A. Cierpka, S. Keckert, J. Knobloch, F. Kramer, and O. Kugeler, “Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials”, in Proc. SRF'23, Grand Rapids, MI, USA, Jun. 2023, pp. 80-83. doi:10.18429/JACoW-SRF2023-MOPMB010

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