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[n]	T. H. Uesugi, T. Fujimoto, T. Furukawa, T. Naruse, K. Noda, and S. Shibuya, “Study of Multiturn Injection at HIMAC Synchrotron”, in Proc. EPAC'04, Lucerne, Switzerland, Jul. 2004, paper THPLT065, pp. 2640-2642. 
[n]	P. Yu. Shatunov et al., “Collector Ring Project at FAIR: Present Status”, in Proc. RuPAC'16, Saint Petersburg, Russia, Nov. 2016, pp. 87-90. doi:10.18429/JACoW-RUPAC2016-WECBMH02
[n]	H. Freund, L. Giannessi, C. R. Frascati, and W. H. Miner, “The Effect of Shot-Noise on the Start-Up of the Fundamental and Harmonics in Free-Electron Lasers”, in Proc. FEL'08, Gyeongju, Korea, Aug. 2008, paper MOPPH003, pp. 9-12. 
[n]	D. P. May et al., “Status of the Texas AM K500 Superconducting Cyclotron”, in Proc. Cyclotrons'84, East Lansing, MI, USA, Apr.-May 1984, paper F05, pp. 267-270. 
[n]	F. P. Mooring, R. L. Amrein, and A. Langsdorf, “Upgrading the Argonne 4-mV Dynamitron”, in Proc. PAC'75, Washington D.C., USA, Mar. 1975, pp. 1726-1730. 
[n]	J. Y. Yoon, J. H. Han, E. Kako, E.-S. Kim, and H. S. Park, “Design Study of the Third Harmonic Superconducting Cavity for a Bunch Lengthening”, in Proc. IPAC'22, Bangkok, Thailand, Jun. 2022, pp. 1258-1260. doi:10.18429/JACoW-IPAC2022-TUPOTK025
[n]	Y. Hirao et al., “Test Accumulation Ring for the NUMATRON Project - TARN”, in Proc. PAC'79, San Francisco, CA, USA, Mar. 1979, pp. 3730-3736. 
[n]	K. C. Harkay, “Observation and Modeling of Electron Cloud Instability”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper WEXFI02, pp. 1887-1891. 
[n]	M. Balcazar et al., “Early lasing at LCLS and its implications for future cavity-based XFELs”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 424-427. doi:10.18429/JACoW-IPAC2024-MOPG70
[n]	R. C. York et al., “Proposed Upgrade of the NSCL”, in Proc. PAC'95, Dallas, TX, USA, May 1995, paper RPG11, pp. 345-347. 
[n]	M. C. Thompson et al., “The UCLA/FNPL Time Resolved Underdense Plasma Lens Experiment”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper TPAE048, pp. 3013-3015. 
[n]	A. Cierpka, S. Keckert, J. Knobloch, F. Kramer, and O. Kugeler, “Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials”, in Proc. SRF'23, Grand Rapids, MI, USA, Jun. 2023, pp. 80-83. doi:10.18429/JACoW-SRF2023-MOPMB010

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