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[n]	Z. Zhang et al., “Microbunching-Instability-Induced Sidebands in a Seeded Free-Electron Laser”, in Proc. FEL'15, Daejeon, Korea, Aug. 2015, pp. 741-745. doi:10.18429/JACoW-FEL2015-WEP084

[n]	Y. Brischetto, H. Timko, and T. Argyropoulos, “High-resolution bunch profile measurements for enhanced longitudinal beam diagnostics”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2244-2247. doi:10.18429/JACoW-IPAC2024-WEPG23

[n]	M. Borland et al., “High-Brightness Beams from a Light Source Injector: The Advanced Photon Source Low-Energy Undulator Test Line LINAC”, in Proc. LINAC'00, Monterey, CA, USA, Aug. 2000, paper THC19, pp. 899-901. 

[n]	M. Bruchon, B. Visentin, and F. Eozenou, “Electropolishing on Single and MultiI-Cell: COMSOL Modelling”, in Proc. SRF'07, Beijing, China, Oct. 2007, paper TUP51, pp. XX-XX. 

For LaTeX

%\cite{Zhang:FEL15-WEP084} \bibitem{Zhang:FEL15-WEP084} Z. Zhang \emph{et al.}, \textquotedblleft{Microbunching-Instability-Induced Sidebands in a Seeded Free-Electron Laser}\textquotedblright, in \emph{Proc. FEL’15}, Daejeon, Korea, Aug. 2015, pp. 741--745. \doi{10.18429/JACoW-FEL2015-WEP084} %\cite{Brischetto:IPAC24-WEPG23} \bibitem{Brischetto:IPAC24-WEPG23} Y. Brischetto, H. Timko, and T. Argyropoulos, \textquotedblleft{High-resolution bunch profile measurements for enhanced longitudinal beam diagnostics}\textquotedblright, in \emph{Proc. IPAC’24}, Nashville, TN, USA, May 2024, pp. 2244--2247. \doi{10.18429/JACoW-IPAC2024-WEPG23} %\cite{Borl:LINAC00-THC19} \bibitem{Borl:LINAC00-THC19} M. Borland \emph{et al.}, \textquotedblleft{High-Brightness Beams from a Light Source Injector: The Advanced Photon Source Low-Energy Undulator Test Line LINAC}\textquotedblright, in \emph{Proc. LINAC’00}, Monterey, CA, USA, Aug. 2000, paper THC19, pp. 899--901. %\cite{Bruchon:SRF07-TUP51} \bibitem{Bruchon:SRF07-TUP51} M. Bruchon, B. Visentin, and F. Eozenou, \textquotedblleft{Electropolishing on Single and MultiI-Cell: COMSOL Modelling}\textquotedblright, in \emph{Proc. SRF’07}, Beijing, China, Oct. 2007, paper TUP51, pp. XX--XX.

For BibTeX

@inproceedings{zhang:fel15-wep084, author = {Z. Zhang and others}, title = {{Microbunching-Instability-Induced Sidebands in a Seeded Free-Electron Laser}}, booktitle = {Proc. FEL'15}, pages = {741--745}, paper = {WEP084}, venue = {Daejeon, Korea, Aug. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-FEL2015-WEP084}, url = {https://jacow.org/FEL2015/papers/WEP084.pdf}, language = {english} } @inproceedings{brischetto:ipac24-wepg23, author = {Y. Brischetto and H. Timko and T. Argyropoulos}, title = {{High-resolution bunch profile measurements for enhanced longitudinal beam diagnostics}}, booktitle = {Proc. IPAC'24}, pages = {2244--2247}, paper = {WEPG23}, venue = {Nashville, TN, USA}, series = {International Particle Accelerator Conference}, number = {15}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2024}, issn = {2673-5490}, isbn = {978-3-95-450247-9}, doi = {10.18429/JACoW-IPAC2024-WEPG23}, language = {english} } @inproceedings{borl:linac00-thc19, author = {M. Borland and others}, title = {{High-Brightness Beams from a Light Source Injector: The Advanced Photon Source Low-Energy Undulator Test Line LINAC}}, booktitle = {Proc. LINAC'00}, pages = {899--901}, paper = {THC19}, venue = {Monterey, CA, USA, Aug. 2000}, series = {Linear Accelerator Conference}, number = {20}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/l00/papers/THC19.pdf}, language = {english} } @inproceedings{bruchon:srf07-tup51, author = {M. Bruchon and B. Visentin and F. Eozenou}, title = {{Electropolishing on Single and MultiI-Cell: COMSOL Modelling}}, booktitle = {Proc. SRF'07}, paper = {TUP51}, venue = {Beijing, China, Oct. 2007}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/srf2007/papers/TUP51.pdf}, language = {english} }

References

• Z. Zhang et al., “Microbunching-Instability-Induced Sidebands in a Seeded Free-Electron Laser”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 741-745.
• Y. Brischetto, H. Timko, and T. Argyropoulos, “High-resolution bunch profile measurements for enhanced longitudinal beam diagnostics”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPG23, pp. 2244-2247.
• M. Borland et al., “High-Brightness Beams from a Light Source Injector: The Advanced Photon Source Low-Energy Undulator Test Line LINAC”, in Proc. 20th Linear Accelerator Conf. (LINAC'00), Monterey, CA, USA, Aug. 2000, paper THC19, pp. 899-901.
• M. Bruchon, B. Visentin, and F. Eozenou, “Electropolishing on Single and MultiI-Cell: COMSOL Modelling”, in Proc. 13th Int. Conf. RF Superconductivity (SRF'07), Beijing, China, Oct. 2007, paper TUP51, pp. XX-XX.