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[n]	M. Kireeff Covo et al., “Beam Energy Scaling of Ion-Induced Electron Yield from K+ Ions Impact on Stainless Steel Surfaces”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper FPAP033, pp. 2287-2288. 
[n]	E. Yamakawa et al., “Study of Single Wire Scanner Monitor for FETS-FFA Test Ring”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 377-381. doi:10.18429/JACoW-IBIC2023-WEP019

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