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[n] A. Blednykh, D. Zhou, M. Blaskiewicz, and R. Lindberg, “Microwave instability threshold from coherent wiggler radiation impedance in storage rings”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 1085-1087. doi:10.18429/JACoW-IPAC2023-MOPM043
[n] M. H. Cho et al., “Recent status of PAL-XFEL”, presented at the FLS'23, Luzern, Switzerland, Aug.-Sep. 2023, paper MO3A6, unpublished.
[n] H. J. Zheng et al., “Higher Order Mode Damping for 166 MHz and 500 MHz Superconducting RF Cavities at High Energy Photon Source”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 2798-2801. doi:10.18429/JACoW-IPAC2021-WEPAB090
[n] W. Blokland and M. Schram, “Machine learning for improved accelerator and target reliability”, presented at the IPAC'24, Nashville, TN, USA, May 2024, paper THXD1, unpublished.
[n] J. Guo et al., “Studies on Superconducting Thin Films for SRF Applications”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper THP042, pp. 854-856.
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References
- A. Blednykh, D. Zhou, M. Blaskiewicz, and R. Lindberg, “Microwave instability threshold from coherent wiggler radiation impedance in storage rings”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper MOPM043, pp. 1085-1087.
- M. H. Cho et al., “Recent status of PAL-XFEL”, presented at the 67th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'23), Luzern, Switzerland, Aug.-Sep. 2023, paper MO3A6, unpublished.
- H. J. Zheng et al., “Higher Order Mode Damping for 166 MHz and 500 MHz Superconducting RF Cavities at High Energy Photon Source”, in Proc. 12th Int. Particle Accelerator Conf. (IPAC'21), Campinas, Brazil, May 2021, pp. 2798-2801.
- W. Blokland and M. Schram, “Machine learning for improved accelerator and target reliability”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper THXD1, unpublished.
- J. Guo et al., “Studies on Superconducting Thin Films for SRF Applications”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP042, pp. 854-856.
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