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[n]	G. Umapathy and S. Ghosh, “Investigation of mechanical stability of silicon carbide in aluminium oxide under high temperature and 800 keV Ar ion irradiation”, presented at the HIAT'25, East Lansing, MI, USA, Jun. 2025, paper TUP02, unpublished. 
[n]	S. Lidia, H. Clark, P. Linardakis, T. McGoram, L. Phair, and D. Steski, “Recent developments in low and medium energy ion beam facilities for radiation effects testing”, presented at the HIAT'25, East Lansing, MI, USA, Jun. 2025, paper THX02, unpublished. 
[n]	Y. Zhai, L. Sun, Y. Yang, B. Zhang, and H. Zhao, “Study on synergistic irradiation effects of nuclear materials based on cocktail ion beam technology”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 129-131. doi:10.18429/JACoW-HIAT2025-TUP03
[n]	T. Nishi et al., “Development of automatic beam tuning system using Bayesian optimization for high intensity heavy ion beams at RIBF”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 148-151. doi:10.18429/JACoW-HIAT2025-TUP09
[n]	X. Wang, S. Carter, S. Chrenka, T. Kanemura, A. Plastun, and D. Simon, “Monte-Carlo simulation of vacuum system for advanced charge selector”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 140-143. doi:10.18429/JACoW-HIAT2025-TUP06
[n]	A. Ravichandran and B. Mustapha, “The ATLAS AI-ML Dashboard”, presented at the HIAT'25, East Lansing, MI, USA, Jun. 2025, paper TUP10, unpublished. 
[n]	S. Cogan et al., “Beam loss detection and mitigation at FRIB”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 238-240. doi:10.18429/JACoW-HIAT2025-WEP07
[n]	J. Wan, H. Alamprese, Y. Hao, J. Qiang, and C. Ratcliff, “JuTrack, a Julia-based tool for accelerator modeling and tracking with auto-differentiation”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 245-247. doi:10.18429/JACoW-HIAT2025-WEP09
[n]	K. Holland, R. Bliton, A. Kohler, and L. Nguyen, “Design and operational experience of FRIB magnet and electrostatic power supplies”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 177-180. doi:10.18429/JACoW-HIAT2025-TUP23

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