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[n]	S. Mathews, A. Macpherson, and N. Stapley, “An end-to-end approach of optical inspection on the RF surface”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, pp. 597-603. doi:10.18429/JACoW-SRF2025-THB03

For LaTeX

%\cite{Mathews:SRF25-THB03} \bibitem{Mathews:SRF25-THB03} S. Mathews, A. Macpherson, and N. Stapley, \textquotedblleft{An end-to-end approach of optical inspection on the RF surface}\textquotedblright, in \emph{Proc. SRF’25}, Tokyo, Japan, Sep. 2025, pp. 597--603. \doi{10.18429/JACoW-SRF2025-THB03}

For BibTeX

@inproceedings{mathews:srf25-thb03, author = {S. Mathews and A. Macpherson and N. Stapley}, title = {{An end-to-end approach of optical inspection on the RF surface}}, booktitle = {Proc. SRF'25}, pages = {597--603}, paper = {THB03}, venue = {Tokyo, Japan}, series = {Int. Conf. on RF Superconductivity}, number = {22}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2026}, issn = {2673-5504}, isbn = {978-3-95-450256-1}, doi = {10.18429/JACoW-SRF2025-THB03}, language = {english} }

References

• S. Mathews, A. Macpherson, and N. Stapley, “An end-to-end approach of optical inspection on the RF surface”, in Proc. 22st International Conference on RF Superconductivity (SRF'25), Tokyo, Japan, Sep. 2025, pp. 597-603.