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[n] M. Schneider et al., “REBCO sample testing for a HTS high Q cavity”, in Proc. IPAC'23, Venice, Italy, May 2023, pp. 3067-3070. doi:10.18429/JACoW-IPAC2023-WEPA183
[n] R. E. Hill, “LAMPF First-Fault Identifier for Fast Transient Faults”, in Proc. LINAC'79, Montauk, NY, USA, Sep. 1979, paper S5-4, pp. 283-285.
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References
- M. Schneider et al., “REBCO sample testing for a HTS high Q cavity”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper WEPA183, pp. 3067-3070.
- R. E. Hill, “LAMPF First-Fault Identifier for Fast Transient Faults”, in Proc. 1979 Linear Accelerator Conf. (LINAC'79), Montauk, NY, USA, Sep. 1979, paper S5-4, pp. 283-285.
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