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[n]	F. Becker, C. A. Andre, P. Forck, and D. Hoffmann, “Beam Induced Fluorescence (BIF) Monitor for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams”, in Proc. DIPAC'07, Venice, Italy, May 2007, paper MOO3A02, pp. 33-35. 
[n]	U. Iriso and A. Olmos, “Electron Beam Diagnostics for the ALBA Light Source”, in Proc. DIPAC'07, Venice, Italy, May 2007, paper MOD1A03, pp. 27-29. 

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