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[n]	H. Jiang, T. R. Bieler, C. Compton, and T. L. Grimm, “Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds”, in Proc. SRF'05, Ithaca, NY, USA, Jul. 2005, paper TUP53, pp. 369-371. 

For LaTeX

%\cite{Jiang:SRF05-TUP53} \bibitem{Jiang:SRF05-TUP53} H. Jiang, T. R. Bieler, C. Compton, and T. L. Grimm, \textquotedblleft{Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds}\textquotedblright, in \emph{Proc. SRF’05}, Ithaca, NY, USA, Jul. 2005, paper TUP53, pp. 369--371.

For BibTeX

@inproceedings{jiang:srf05-tup53, author = {H. Jiang and T. R. Bieler and C. Compton and T. L. Grimm}, title = {{Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds}}, booktitle = {Proc. SRF'05}, pages = {369--371}, paper = {TUP53}, venue = {Ithaca, NY, USA, Jul. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2005/papers/TUP53.pdf}, language = {english} }

References

• H. Jiang, T. R. Bieler, C. Compton, and T. L. Grimm, “Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper TUP53, pp. 369-371.