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[n] E. Schneidmiller and M. V. Yurkov, “Obtaining High Degree of Circular Polarization at X-ray FELs via a Reverse Undulator Taper”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 2870-2872. doi:10.18429/JACoW-IPAC2014-THPRO008
[n] N. Munemoto et al., “Laser Ablation Ion Source for the KEK Digital Accelerator”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 598-600. doi:10.18429/JACoW-IPAC2014-MOPRI010
[n] M. Yoshida et al., “Longitudinal Manipulation to Obtain and Keep the Low Emittance and High Charge Electron Beam for SuperKEKB Injector”, in Proc. IPAC'13, Shanghai, China, May 2013, paper TUPFI004, pp. 1337-1339.
[n] I. Bellafont, R. Kersevan, and L. Mether, “Summary of Modelling Studies on the Beam Induced Vacuum Effects in the FCC-hh”, in Proc. IPAC'19, Melbourne, Australia, May 2019, pp. 1331-1334. doi:10.18429/JACoW-IPAC2019-TUPMP038
[n] Q. Qin, “Performance and Prospects of BEPCII”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper TUYA03, pp. 1030-1034.
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References
- E. Schneidmiller and M. V. Yurkov, “Obtaining High Degree of Circular Polarization at X-ray FELs via a Reverse Undulator Taper”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 2870-2872.
- N. Munemoto et al., “Laser Ablation Ion Source for the KEK Digital Accelerator”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 598-600.
- M. Yoshida et al., “Longitudinal Manipulation to Obtain and Keep the Low Emittance and High Charge Electron Beam for SuperKEKB Injector”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper TUPFI004, pp. 1337-1339.
- I. Bellafont, R. Kersevan, and L. Mether, “Summary of Modelling Studies on the Beam Induced Vacuum Effects in the FCC-hh”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 1331-1334.
- Q. Qin, “Performance and Prospects of BEPCII”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper TUYA03, pp. 1030-1034.
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