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[n]	R. Kumar and S. J. Vala, “Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source”, presented at the ECRIS'22, Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished. 

[n]	M. Mwaniki, R. Ainsworth, P. Snopok, and R. Thurman-Keup, “Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector”, in Proc. IPAC'25, Taipei, Taiwan, Jun. 2025, pp. 1670-1673. doi:10.18429/JACoW-IPAC2025-WEAN1

[n]	Z. Q. Yang, L. Lin, X. Y. Lu, W. W. Tan, D. Y. Yang, and J. Zhao, “TOF-SIMS Study of Nitrogen Doping Niobium Samples”, in Proc. SRF'15, Whistler, Canada, Sep. 2015, paper MOPB036, pp. 169-173. 

For LaTeX

%\cite{Kumar:ECRIS22-WEP1PG005} \bibitem{Kumar:ECRIS22-WEP1PG005} R. Kumar and S. J. Vala, \textquotedblleft{Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source}\textquotedblright, presented at the ECRIS’22, Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished. %\cite{Mwaniki:IPAC25-WEAN1} \bibitem{Mwaniki:IPAC25-WEAN1} M. Mwaniki, R. Ainsworth, P. Snopok, and R. Thurman-Keup, \textquotedblleft{Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector}\textquotedblright, in \emph{Proc. IPAC’25}, Taipei, Taiwan, Jun. 2025, pp. 1670--1673. \doi{10.18429/JACoW-IPAC2025-WEAN1} %\cite{Yang:SRF15-MOPB036} \bibitem{Yang:SRF15-MOPB036} Z. Q. Yang, L. Lin, X. Y. Lu, W. W. Tan, D. Y. Yang, and J. Zhao, \textquotedblleft{TOF-SIMS Study of Nitrogen Doping Niobium Samples}\textquotedblright, in \emph{Proc. SRF’15}, Whistler, Canada, Sep. 2015, paper MOPB036, pp. 169--173.

For BibTeX

@unpublished{kumar:ecris22-wep1pg005, author = {R. Kumar and S. J. Vala}, title = {{Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source}}, pages = {}, paper = {WEP1PG005}, venue = {Ahmedabad, India, Oct. 2022}, intype = {presented at the}, series = {International Workshop on ECR Ion Sources}, number = {25}, publisher = {JACoW Publishing, Geneva, Switzerland}, note = {presented at ECRIS'22, Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished}, language = {english} } @inproceedings{mwaniki:ipac25-wean1, author = {M. Mwaniki and R. Ainsworth and P. Snopok and R. Thurman-Keup}, title = {{Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector}}, booktitle = {Proc. IPAC'25}, pages = {1670--1673}, paper = {WEAN1}, venue = {Taipei, Taiwan}, series = {International Particle Accelerator Conference}, number = {16}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2025}, issn = {2673-5490}, isbn = {978-3-95-450248-6}, doi = {10.18429/JACoW-IPAC2025-WEAN1}, language = {english} } @inproceedings{yang:srf15-mopb036, author = {Z. Q. Yang and L. Lin and X. Y. Lu and W. W. Tan and D. Y. Yang and J. Zhao}, title = {{TOF-SIMS Study of Nitrogen Doping Niobium Samples}}, booktitle = {Proc. SRF'15}, pages = {169--173}, paper = {MOPB036}, venue = {Whistler, Canada, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2015/papers/MOPB036.pdf}, language = {english} }

References

• R. Kumar and S. J. Vala, “Effect of Length of ECR Region on Electron Temperature and Density in a Multi Charged Ion Source”, presented at the 25th International Workshop on ECR Ion Sources (ECRIS'22), Ahmedabad, India, Oct. 2022, paper WEP1PG005, unpublished.
• M. Mwaniki, R. Ainsworth, P. Snopok, and R. Thurman-Keup, “Measurement techniques using the electron beam profile scanner at the Fermilab Main Injector”, in Proc. 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper WEAN1, pp. 1670-1673.
• Z. Q. Yang, L. Lin, X. Y. Lu, W. W. Tan, D. Y. Yang, and J. Zhao, “TOF-SIMS Study of Nitrogen Doping Niobium Samples”, in Proc. 17th Int. Conf. RF Superconductivity (SRF'15), Whistler, Canada, Sep. 2015, paper MOPB036, pp. 169-173.