Reference Search

Favourites

For Word

[n]	C. Huang et al., “Monte-Carlo photoemission model for thin film semiconductors under high fields”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2097-2100. doi:10.18429/JACoW-IPAC2024-WEPC58

[n]	R. Maier et al., “Non-Beam Disturbing Diagnostics at COSY-Juelich”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 800-803. 

[n]	T. Gromme et al., “Slow Feedback Systems for PEP-II”, in Proc. EPAC'00, Vienna, Austria, Jun. 2000, paper WEP2A15, pp. 1897-1899. 

[n]	Y. C. Xu, Y. Z. Chen, K. C. Chu, L. F. Han, Y. B. Leng, and G. B. Zhao, “A New Beam Profile Diagnostic System based on the Industrial Ethernet”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper MOPE033, pp. 1044-1046. 

For LaTeX

%\cite{Huang:IPAC24-WEPC58} \bibitem{Huang:IPAC24-WEPC58} C. Huang \emph{et al.}, \textquotedblleft{Monte-Carlo photoemission model for thin film semiconductors under high fields}\textquotedblright, in \emph{Proc. IPAC’24}, Nashville, TN, USA, May 2024, pp. 2097--2100. \doi{10.18429/JACoW-IPAC2024-WEPC58} %\cite{Maier:EPAC90} \bibitem{Maier:EPAC90} R. Maier \emph{et al.}, \textquotedblleft{Non-Beam Disturbing Diagnostics at COSY-Juelich}\textquotedblright, in \emph{Proc. EPAC’90}, Nice, France, Jun. 1990, pp. 800--803. %\cite{Gromme:EPAC00-WEP2A15} \bibitem{Gromme:EPAC00-WEP2A15} T. Gromme \emph{et al.}, \textquotedblleft{Slow Feedback Systems for PEP-II}\textquotedblright, in \emph{Proc. EPAC’00}, Vienna, Austria, Jun. 2000, paper WEP2A15, pp. 1897--1899. %\cite{YCXu:IPAC10-MOPE033} \bibitem{YCXu:IPAC10-MOPE033} Y. C. Xu, Y. Z. Chen, K. C. Chu, L. F. Han, Y. B. Leng, and G. B. Zhao, \textquotedblleft{A New Beam Profile Diagnostic System based on the Industrial Ethernet}\textquotedblright, in \emph{Proc. IPAC’10}, Kyoto, Japan, May 2010, paper MOPE033, pp. 1044--1046.

For BibTeX

@inproceedings{huang:ipac24-wepc58, author = {C. Huang and others}, title = {{Monte-Carlo photoemission model for thin film semiconductors under high fields}}, booktitle = {Proc. IPAC'24}, pages = {2097--2100}, paper = {WEPC58}, venue = {Nashville, TN, USA}, series = {International Particle Accelerator Conference}, number = {15}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2024}, issn = {2673-5490}, isbn = {978-3-95-450247-9}, doi = {10.18429/JACoW-IPAC2024-WEPC58}, language = {english} } @inproceedings{maier:epac90, author = {R. Maier and others}, title = {{Non-Beam Disturbing Diagnostics at COSY-Juelich}}, booktitle = {Proc. EPAC'90}, pages = {800--803}, paper = {}, venue = {Nice, France, Jun. 1990}, series = {European Particle Accelerator Conference}, number = {2}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @inproceedings{gromme:epac00-wep2a15, author = {T. Gromme and others}, title = {{Slow Feedback Systems for PEP-II}}, booktitle = {Proc. EPAC'00}, pages = {1897--1899}, paper = {WEP2A15}, venue = {Vienna, Austria}, series = {European Particle Accelerator Conference}, number = {7}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {8}, year = {2000}, url = {https://jacow.org/e00/papers/WEP2A15.pdf}, language = {english} } @inproceedings{ycxu:ipac10-mope033, author = {Y. C. Xu and Y. Z. Chen and K. C. Chu and L. F. Han and Y. B. Leng and G. B. Zhao}, title = {{A New Beam Profile Diagnostic System based on the Industrial Ethernet}}, booktitle = {Proc. IPAC'10}, pages = {1044--1046}, paper = {MOPE033}, venue = {Kyoto, Japan, May 2010}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {http://accelconf.web.cern.ch/IPAC10/papers/MOPE033.pdf}, language = {english} }

References

• C. Huang et al., “Monte-Carlo photoemission model for thin film semiconductors under high fields”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPC58, pp. 2097-2100.
• R. Maier et al., “Non-Beam Disturbing Diagnostics at COSY-Juelich”, in Proc. 2nd European Particle Accelerator Conf. (EPAC'90), Nice, France, Jun. 1990, pp. 800-803.
• T. Gromme et al., “Slow Feedback Systems for PEP-II”, in Proc. 7th European Particle Accelerator Conf. (EPAC'00), Vienna, Austria, Jun. 2000, paper WEP2A15, pp. 1897-1899.
• Y. C. Xu, Y. Z. Chen, K. C. Chu, L. F. Han, Y. B. Leng, and G. B. Zhao, “A New Beam Profile Diagnostic System based on the Industrial Ethernet”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper MOPE033, pp. 1044-1046.