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[n]	J. F. DeFord, N. J. Dionne, S. G. Ovtchinnikov, and J. J. Petillo, “Inclusion of Surface Roughness Effects in Emission Modeling With the MICHELLE Code”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper WEP160, pp. 1788-1790. 
[n]	F. B?©dker et al., “In-vacuum and FEL Undulators at Danfysik”, in Proc. EPAC'06, Edinburgh, UK, Jun. 2006, paper THPLS117, pp. 3553-3555. 
[n]	T. Reid, Z. A. Conway, S. M. Gerbick, M. Kedzie, M. P. Kelly, and P. N. Ostroumov, “Electropolishing for Low-Beta and Quasi-Waveguide SRF Cavities”, in Proc. IPAC'15, Richmond, VA, USA, May 2015, pp. 3273-3275. doi:10.18429/JACoW-IPAC2015-WEPTY010

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