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[n]	E. A. Wadlinger, “Scaling Laws for RFQ Design Procedures”, in Proc. PAC'85, Vancouver, Canada, May 1985, pp. 2596-2599. 

[n]	J. Hirschman et al., “High-throughput, low-latency X-ray characterization for attosecond XFEL diagnostics: A heterogeneous approach”, presented at the NAPAC'25, Sacramento, California, USA, Aug. 2025, paper MOP046, unpublished. 

[n]	H. H. Rose and W. Wan, “Aberration Correction in Electron Microscopy”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper WOAC001, pp. 44-48. 

For LaTeX

%\cite{Wadlinger:PAC85} \bibitem{Wadlinger:PAC85} E. A. Wadlinger, \textquotedblleft{Scaling Laws for RFQ Design Procedures}\textquotedblright, in \emph{Proc. PAC’85}, Vancouver, Canada, May 1985, pp. 2596--2599. %\cite{Hirschman:NAPAC25-MOP046} \bibitem{Hirschman:NAPAC25-MOP046} J. Hirschman \emph{et al.}, \textquotedblleft{High-throughput, low-latency X-ray characterization for attosecond XFEL diagnostics: A heterogeneous approach}\textquotedblright, presented at the NAPAC’25, Sacramento, California, USA, Aug. 2025, paper MOP046, unpublished. %\cite{Rose:PAC05-WOAC001} \bibitem{Rose:PAC05-WOAC001} H. H. Rose and W. Wan, \textquotedblleft{Aberration Correction in Electron Microscopy}\textquotedblright, in \emph{Proc. PAC’05}, Knoxville, TN, USA, May 2005, paper WOAC001, pp. 44--48.

For BibTeX

@inproceedings{wadlinger:pac85, author = {E. A. Wadlinger}, title = {{Scaling Laws for RFQ Design Procedures}}, booktitle = {Proc. PAC'85}, pages = {2596--2599}, paper = {}, venue = {Vancouver, Canada, May 1985}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} } @unpublished{hirschman:napac25-mop046, author = {J. Hirschman and others}, title = {{High-throughput, low-latency X-ray characterization for attosecond XFEL diagnostics: A heterogeneous approach}}, booktitle = {Proc. NAPAC'25}, pages = {}, paper = {MOP046}, venue = {Sacramento, California, USA}, intype = {presented at the}, series = {North American Particle Accelerator Conference}, number = {6}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {1}, year = {2026}, issn = {2673-7000}, isbn = {978-3-95-450261-5}, note = {presented at NAPAC'25, Sacramento, California, USA, Aug. 2025, paper MOP046, unpublished}, language = {english} } @inproceedings{rose:pac05-woac001, author = {H. H. Rose and W. Wan}, title = {{Aberration Correction in Electron Microscopy}}, booktitle = {Proc. PAC'05}, pages = {44--48}, paper = {WOAC001}, venue = {Knoxville, TN, USA, May 2005}, series = {Particle Accelerator Conference}, number = {21}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p05/papers/WOAC001.pdf}, language = {english} }

References

• E. A. Wadlinger, “Scaling Laws for RFQ Design Procedures”, in Proc. 11th Particle Accelerator Conf. (PAC'85), Vancouver, Canada, May 1985, pp. 2596-2599.
• J. Hirschman et al., “High-throughput, low-latency X-ray characterization for attosecond XFEL diagnostics: A heterogeneous approach”, presented at the 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, paper MOP046, unpublished.
• H. H. Rose and W. Wan, “Aberration Correction in Electron Microscopy”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WOAC001, pp. 44-48.