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[n]	N. Hafz, D.-K. Ko, and J. Lee, “Generation of Stable GeV-class Electron Beams from Laser-Plasmas and their Applications in Compact FELs”, in Proc. FEL'08, Gyeongju, Korea, Aug. 2008, paper THCAU05, pp. 521-523. 

[n]	H. H. Rose and W. Wan, “Aberration Correction in Electron Microscopy”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper WOAC001, pp. 44-48. 

[n]	W. Blokland, “Recent Developments on High Intensity Beam Diagnostics at SNS”, in Proc. HB'12, Beijing, China, Sep. 2012, paper TUO1C01, pp. 292-296. 

For LaTeX

%\cite{Hafz:FEL08-THCAU05} \bibitem{Hafz:FEL08-THCAU05} N. Hafz, D.-K. Ko, and J. Lee, \textquotedblleft{Generation of Stable GeV-class Electron Beams from Laser-Plasmas and their Applications in Compact FELs}\textquotedblright, in \emph{Proc. FEL’08}, Gyeongju, Korea, Aug. 2008, paper THCAU05, pp. 521--523. %\cite{Rose:PAC05-WOAC001} \bibitem{Rose:PAC05-WOAC001} H. H. Rose and W. Wan, \textquotedblleft{Aberration Correction in Electron Microscopy}\textquotedblright, in \emph{Proc. PAC’05}, Knoxville, TN, USA, May 2005, paper WOAC001, pp. 44--48. %\cite{Blokl:HB12-TUO1C01} \bibitem{Blokl:HB12-TUO1C01} W. Blokland, \textquotedblleft{Recent Developments on High Intensity Beam Diagnostics at SNS}\textquotedblright, in \emph{Proc. HB’12}, Beijing, China, Sep. 2012, paper TUO1C01, pp. 292--296.

For BibTeX

@inproceedings{hafz:fel08-thcau05, author = {N. Hafz and D.-K. Ko and J. Lee}, title = {{Generation of Stable GeV-class Electron Beams from Laser-Plasmas and their Applications in Compact FELs}}, booktitle = {Proc. FEL'08}, pages = {521--523}, paper = {THCAU05}, venue = {Gyeongju, Korea, Aug. 2008}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/FEL2008/papers/THCAU05.pdf}, language = {english} } @inproceedings{rose:pac05-woac001, author = {H. H. Rose and W. Wan}, title = {{Aberration Correction in Electron Microscopy}}, booktitle = {Proc. PAC'05}, pages = {44--48}, paper = {WOAC001}, venue = {Knoxville, TN, USA, May 2005}, series = {Particle Accelerator Conference}, number = {21}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/p05/papers/WOAC001.pdf}, language = {english} } @inproceedings{blokl:hb12-tuo1c01, author = {W. Blokland}, title = {{Recent Developments on High Intensity Beam Diagnostics at SNS}}, booktitle = {Proc. HB'12}, pages = {292--296}, paper = {TUO1C01}, venue = {Beijing, China, Sep. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/HB2012/papers/TUO1C01.pdf}, language = {english} }

References

• N. Hafz, D.-K. Ko, and J. Lee, “Generation of Stable GeV-class Electron Beams from Laser-Plasmas and their Applications in Compact FELs”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper THCAU05, pp. 521-523.
• H. H. Rose and W. Wan, “Aberration Correction in Electron Microscopy”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WOAC001, pp. 44-48.
• W. Blokland, “Recent Developments on High Intensity Beam Diagnostics at SNS”, in Proc. 52nd ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'12), Beijing, China, Sep. 2012, paper TUO1C01, pp. 292-296.