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[n]	E. A. Wadlinger, “Scaling Laws for RFQ Design Procedures”, in Proc. PAC'85, Vancouver, Canada, May 1985, pp. 2596-2599. 
[n]	J. Hirschman et al., “High-throughput, low-latency X-ray characterization for attosecond XFEL diagnostics: A heterogeneous approach”, presented at the NAPAC'25, Sacramento, California, USA, Aug. 2025, paper MOP046, unpublished. 

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